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VDMOSFET reliability dependence on the integrated drain‐source junction |  Emerald Insight
VDMOSFET reliability dependence on the integrated drain‐source junction | Emerald Insight

Color online) Relative permittivity and relative capacitance of... |  Download Scientific Diagram
Color online) Relative permittivity and relative capacitance of... | Download Scientific Diagram

Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides  Observed by Fast Pulse CV Measurement
Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides Observed by Fast Pulse CV Measurement

Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides  Observed by Fast Pulse CV Measurement
Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides Observed by Fast Pulse CV Measurement

Interface defects detection and quantification on a Si/SiO2 structure
Interface defects detection and quantification on a Si/SiO2 structure

Variation of capacitance with frequency | Download Scientific Diagram
Variation of capacitance with frequency | Download Scientific Diagram

PDF) Fast and robust 3D electrical capacitance tomography
PDF) Fast and robust 3D electrical capacitance tomography

Applied Sciences | Free Full-Text | Lateral Capacitance–Voltage Method of  NanoMOSFET for Detecting the Hot Carrier Injection
Applied Sciences | Free Full-Text | Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection

Analysis of AlGaN/GaN HEMT and Its Operational Improvement Using a Grated  Gate Field Plate | SpringerLink
Analysis of AlGaN/GaN HEMT and Its Operational Improvement Using a Grated Gate Field Plate | SpringerLink

Physics-Based Analytical Model for Input, Output, and Reverse Capacitance  of a GaN HEMT With the Field-Plate Structure | Semantic Scholar
Physics-Based Analytical Model for Input, Output, and Reverse Capacitance of a GaN HEMT With the Field-Plate Structure | Semantic Scholar

Variation of capacitance with frequency | Download Scientific Diagram
Variation of capacitance with frequency | Download Scientific Diagram

Interplay of quantum capacitance with Van der Waals forces, intercalation,  co-intercalation, and the number of MoS2 layers - ScienceDirect
Interplay of quantum capacitance with Van der Waals forces, intercalation, co-intercalation, and the number of MoS2 layers - ScienceDirect

Gigabit-per-second dual-gate MESFET switching and multiplexer operation for  high-speed fiber-optic systems
Gigabit-per-second dual-gate MESFET switching and multiplexer operation for high-speed fiber-optic systems

Degradation of the Capacitance-Voltage Behaviors of the Low-Temperature  Polysilicon TFTs under DC Stress
Degradation of the Capacitance-Voltage Behaviors of the Low-Temperature Polysilicon TFTs under DC Stress

Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides  Observed by Fast Pulse CV Measurement
Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides Observed by Fast Pulse CV Measurement

Physics-Based Analytical Model for Input, Output, and Reverse Capacitance  of a GaN HEMT With the Field-Plate Structure | Semantic Scholar
Physics-Based Analytical Model for Input, Output, and Reverse Capacitance of a GaN HEMT With the Field-Plate Structure | Semantic Scholar

Electronics | Free Full-Text | 3.3-kV 4H-SiC Split-Gate DMOSFET with  Floating p+ Polysilicon for High-Frequency Applications
Electronics | Free Full-Text | 3.3-kV 4H-SiC Split-Gate DMOSFET with Floating p+ Polysilicon for High-Frequency Applications

Applied Sciences | Free Full-Text | Lateral Capacitance–Voltage Method of  NanoMOSFET for Detecting the Hot Carrier Injection
Applied Sciences | Free Full-Text | Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection

Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides  Observed by Fast Pulse CV Measurement
Materials | Free Full-Text | Hysteresis in Lanthanide Aluminum Oxides Observed by Fast Pulse CV Measurement

Degradation of the Capacitance-Voltage Behaviors of the Low-Temperature  Polysilicon TFTs under DC Stress
Degradation of the Capacitance-Voltage Behaviors of the Low-Temperature Polysilicon TFTs under DC Stress

Applied Sciences | Free Full-Text | Lateral Capacitance–Voltage Method of  NanoMOSFET for Detecting the Hot Carrier Injection
Applied Sciences | Free Full-Text | Lateral Capacitance–Voltage Method of NanoMOSFET for Detecting the Hot Carrier Injection

Quantum Capacitance of Two-Dimensional-Material-Based Supercapacitor  Electrodes | Energy & Fuels
Quantum Capacitance of Two-Dimensional-Material-Based Supercapacitor Electrodes | Energy & Fuels

Quantum Capacitance of Two-Dimensional-Material-Based Supercapacitor  Electrodes | Energy & Fuels
Quantum Capacitance of Two-Dimensional-Material-Based Supercapacitor Electrodes | Energy & Fuels

Hysteresis in the I – V various channel lengths. W = 10 | Download  Scientific Diagram
Hysteresis in the I – V various channel lengths. W = 10 | Download Scientific Diagram